Abstract: This paper explores the trade-offs of reducing scan test patterns during Wafer Sort, accepting additional packaging costs, and screening more chips during Package Tests. Previous works ...

If you go all-in on a single feature, that feature should work well. The Viewsonic VG1656N's main feature isn't great, but it ...

Round-the-clock fetal monitoring leads to unnecessary C-sections. But it’s used in nearly every birth because of business and ...

Abstract: Deep neural networks (DNNs) have emerged as an effective approach in many artificial intelligence tasks. Several specialized accelerators are often used to enhance DNN's performance and ...