To analyse the difference between measurement of A and V pattern strabismus at 25° and extreme gaze position in esotropia (ET) and exotropia (XT). This prospective cross-section study included 27 ...
To describe the association between pattern electroretinogram (PERG) amplitude and spectral domain-optical coherence tomography (SD-OCT) macular thickness, retinal nerve fibre layer (RNFL) thickness ...
Anritsu Company introduces the Bit Master MP1026A Eye Pattern Analyzer, the first handheld solution for conducting physical layer (PHY) eye pattern measurements on the high speed interfaces at ...
The new IM-6000 Series image-dimension measurement system features Pattern Registration and Pattern Search functions for simplified “place-and-press” measurement operation. It eliminates the need for ...
The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...
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