This new build processor, developed for Stratasys Neo®450 and Neo®800 stereolithography (SLA) 3D printers, offers up to 50% faster file processing and significantly enhanced print speeds, streamlining ...
Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...
Dictionary indexing compares experimental electron backscatter diffraction (EBSD) images to a dictionary of generated patterns in oriented space for each orientation on a uniform grid. 1,2 The ...
Yield improvement at sub 100-nm technologies relies on the latest scan test techniques. As IC feature sizes shrink below 90 nm, in-line inspection techniques to determine yield-limiting problems ...
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