Palo Alto, Calif.—On the heels of the announcement by Keithley Instruments of its third-generation wafer tester, test-and-measurement giant Agilent Technologies is introducing a Windows-based ...
Keithley Instruments has announced a new CV (capacitance/voltage)-measurement-instrument module for its model 4200-SCS (semiconductor-characterization system). The ...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
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